Size-selective measurements of silicon-cluster polarizabilities by a cluster-beam deflection technique

authored by

J. Woenckhaus, R. Schäfer, J.A. Becker

Organisation(s)

Institute of Physical Chemistry and Electrochemistry

Type

Article

Journal

Surface review and letters

ISSN

0218-625X

Publication date

1996

Publication status

Published

Peer reviewed

Yes

Electronic version(s)

https://doi.org/10.1142/S0218625X9600067X (Access: Unknown)