Charge carrier dynamics at TiO2 particles: Reactivity of free and trapped holes
- authored by
- D.W. Bahnemann, M. Hilgendorff, R. Memming
- Organisation(s)
-
Institute of Technical Chemistry
- Type
- Article
- Journal
- Journal of Physical Chemistry B
- ISSN
- 1520-6106
- Publication date
- 1997
- Publication status
- Published
- Peer reviewed
- Yes