Determination of the propagation constant of coupled lines on chips based on high frequency measurements

authored by

Thomas Michael Winkel, Lohit Sagar Dutta, Hartmut Grabinski, Enno Grotelueschen

Abstract

A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines. The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method will be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements will be presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement.

Organisation(s)

Laboratorium f. Informationstechnologie

Type

Paper

Pages

99-104

No. of pages

6

Publication date

1996

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Electrical and Electronic Engineering

Electronic version(s)

https://doi.org/10.1109/MCMC.1996.510777 (Access: Closed)