Accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements

authored by

Thomas Michael Winkel, Lohit Sagar Dutta, Hartmut Grabinski

Abstract

A very accurate, novel determination of the characteristic impedance of interconnects on semiconducting substrates has been developed. The method is based upon high frequency S-parameter measurements of two transmission lines of different lengths. The influence of the contact structures of the measurement probes are taken into account with the help of three additional measurements. The mathematical background of the method is presented. A comparison of the results obtained from measurements and from calculations is given and shows an excellent agreement.

Organisation(s)

Laboratorium f. Informationstechnologie

Type

Paper

Pages

190-195

No. of pages

6

Publication date

1996

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Electrical and Electronic Engineering

Electronic version(s)

https://doi.org/10.1109/MCMC.1996.510793 (Access: Closed)