High-fidelity transport of trapped-ion qubits through an X-junction trap array

authored by

R. B. Blakestad, C. Ospelkaus, A. P. Vandevender, J. M. Amini, J. Britton, D. Leibfried, D. J. Wineland

External Organisation(s)

National Institute of Standards and Technology (NIST)

Type

Article

Journal

Physical review letters

Volume

102

ISSN

0031-9007

Publication date

16.04.2009

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

General Physics and Astronomy

Electronic version(s)

https://doi.org/10.1103/PhysRevLett.102.153002 (Access: Unknown)
http://arxiv.org/pdf/0901.0533 (Access: Open)