Local internal stress characterization in a tensile-deformed copper single crystal by convergent-beam electron diffraction

authored by: R. R. Keller, H. J. Maier, H. Renner, H. Mughrabi
Abstract: Convergent-beam electron diffraction (CBED) was used to measure localized lattice distortions in single-crystal copper deformed in tension. Local lattice parameters were determined by comparison of experimental zone-axis patterns with computer-simulated patterns employing a kinematical approximation. The observed non-cubic distortions are discussed in terms of residual elastic stresses left in the material after external deformation as a result of the formation of a heterogeneous dislocation microstructure. These internal stresses are modelled semiquantitatively using a composite approach, wherein dislocation cell walls constitute a hard phase and dislocation cell interiors a soft phase. The CBED results support the model's predictions of resultant long-range internal stresses that develop as a consequence of maintaining compatibility between the two deforming phases. Aspects of lattice parameter determination with ⟨001⟩ zone-axis patterns are also discussed.
External Organisation(s): National Institute of Standards and Technology (NIST)
Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU Erlangen-Nürnberg)
University of Siegen
Type: Article
Journal: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume: 70
Pages: 329-340
No. of pages: 12
ISSN: 0141-8610
Publication date: 08.1994
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Electronic, Optical and Magnetic Materials, General Materials Science, Condensed Matter Physics, Physics and Astronomy (miscellaneous), Metals and Alloys
Electronic version(s): https://doi.org/10.1080/01418619408243188 (Access: Unknown)

BibTeX

@article{a60635fd1e924f9faf10d5a36cf85e40,
title = "Local internal stress characterization in a tensile-deformed copper single crystal by convergent-beam electron diffraction",
abstract = "Convergent-beam electron diffraction (CBED) was used to measure localized lattice distortions in single-crystal copper deformed in tension. Local lattice parameters were determined by comparison of experimental zone-axis patterns with computer-simulated patterns employing a kinematical approximation. The observed non-cubic distortions are discussed in terms of residual elastic stresses left in the material after external deformation as a result of the formation of a heterogeneous dislocation microstructure. These internal stresses are modelled semiquantitatively using a composite approach, wherein dislocation cell walls constitute a hard phase and dislocation cell interiors a soft phase. The CBED results support the model's predictions of resultant long-range internal stresses that develop as a consequence of maintaining compatibility between the two deforming phases. Aspects of lattice parameter determination with ⟨001⟩ zone-axis patterns are also discussed.",
author = "Keller, {R. R.} and Maier, {H. J.} and H. Renner and H. Mughrabi",
year = "1994",
month = aug,
doi = "10.1080/01418619408243188",
language = "English",
volume = "70",
pages = "329--340",
journal = "Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties",
issn = "0141-8610",
publisher = "Taylor and Francis Ltd.",
number = "2",
}