Local internal stress characterization in a tensile-deformed copper single crystal by convergent-beam electron diffraction

verfasst von: R. R. Keller, H. J. Maier, H. Renner, H. Mughrabi
Abstract: Convergent-beam electron diffraction (CBED) was used to measure localized lattice distortions in single-crystal copper deformed in tension. Local lattice parameters were determined by comparison of experimental zone-axis patterns with computer-simulated patterns employing a kinematical approximation. The observed non-cubic distortions are discussed in terms of residual elastic stresses left in the material after external deformation as a result of the formation of a heterogeneous dislocation microstructure. These internal stresses are modelled semiquantitatively using a composite approach, wherein dislocation cell walls constitute a hard phase and dislocation cell interiors a soft phase. The CBED results support the model's predictions of resultant long-range internal stresses that develop as a consequence of maintaining compatibility between the two deforming phases. Aspects of lattice parameter determination with ⟨001⟩ zone-axis patterns are also discussed.
Externe Organisation(en): National Institute of Standards and Technology (NIST)
Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU Erlangen-Nürnberg)
Universität Siegen
Typ: Artikel
Journal: Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Band: 70
Seiten: 329-340
Anzahl der Seiten: 12
ISSN: 0141-8610
Publikationsdatum: 08.1994
Publikationsstatus: Veröffentlicht
Peer-reviewed: Ja
ASJC Scopus Sachgebiete: Elektronische, optische und magnetische Materialien, Allgemeine Materialwissenschaften, Physik der kondensierten Materie, Physik und Astronomie (sonstige), Metalle und Legierungen
Elektronische Version(en): https://doi.org/10.1080/01418619408243188 (Zugang: Unbekannt)

BibTeX

@article{a60635fd1e924f9faf10d5a36cf85e40,
title = "Local internal stress characterization in a tensile-deformed copper single crystal by convergent-beam electron diffraction",
abstract = "Convergent-beam electron diffraction (CBED) was used to measure localized lattice distortions in single-crystal copper deformed in tension. Local lattice parameters were determined by comparison of experimental zone-axis patterns with computer-simulated patterns employing a kinematical approximation. The observed non-cubic distortions are discussed in terms of residual elastic stresses left in the material after external deformation as a result of the formation of a heterogeneous dislocation microstructure. These internal stresses are modelled semiquantitatively using a composite approach, wherein dislocation cell walls constitute a hard phase and dislocation cell interiors a soft phase. The CBED results support the model's predictions of resultant long-range internal stresses that develop as a consequence of maintaining compatibility between the two deforming phases. Aspects of lattice parameter determination with ⟨001⟩ zone-axis patterns are also discussed.",
author = "Keller, {R. R.} and Maier, {H. J.} and H. Renner and H. Mughrabi",
year = "1994",
month = aug,
doi = "10.1080/01418619408243188",
language = "English",
volume = "70",
pages = "329--340",
journal = "Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties",
issn = "0141-8610",
publisher = "Taylor and Francis Ltd.",
number = "2",
}