Reduction of droplet emission in random arc technology

authored by
H. D. Steffens, M. Mack, K. Moehwald, K. Reichel
Abstract

The influence of a static magnetic field (0-10 mT at the emission plane of the cathode) in random arc reactive physical vapour deposition (PVD) (TiN, CrN) and non-reactive PVD (titanium, chromium, copper, nickel) has been investigated using various cathode designs. The dominant effect of an increased magnetic field was a more confined arc trace. In non-reactive processes, detrimental selective cathode erosion was observed. In reactive processes, improved nitriding resulted. A distinct reduction in droplet emission was achieved only with a high melting nitride layer (TiN). Cathode design may assist in droplet reduction by further confinement of the arc trace. In all reactive processes, changes in layer microstructure were detected indicating a decrease in ion energy with increasing magnetic field. Surface roughness values comparable with those obtained in steered arc PVD can be achieved, using strong static magnetic fields combined with modified cathode design, if the process is run at a stabilized steady state nitrogen pressure of about 1 Pa from its very start.

External Organisation(s)
TU Dortmund University
Type
Article
Journal
Surface and Coatings Technology
Volume
46
Pages
65-74
No. of pages
10
ISSN
0257-8972
Publication date
30.05.1991
Publication status
Published
Peer reviewed
Yes
ASJC Scopus subject areas
General Chemistry, Condensed Matter Physics, Surfaces and Interfaces, Surfaces, Coatings and Films, Materials Chemistry
Electronic version(s)
https://doi.org/10.1016/0257-8972(91)90150-U (Access: Closed)