Optically trapped probes with nanometer-scale tips for femto-Newton force measurement

authored by

M. R. Pollard, S. W. Botchway, B. Chichkov, E. Freeman, R. N.J. Halsall, D. W.K. Jenkins, I. Loader, A. Ovsianikov, A. W. Parker, R. Stevens, R. Turchetta, A. D. Ward, M. Towrie

Abstract

We describe the development of a novel force probe, controlled by multiple optical traps, with a nanometer-scale tip that protrudes outside the direct laser radiation field. We have measured forces to an accuracy of 240 fN, which enables future experiments that probe photo-sensitive components (such as biological cells) and non-transparent objects. The probes were produced using two methods, electron beam lithography and two-photon polymerization, with the latter providing approximately twice as much trapping stiffness.

External Organisation(s)

Rutherford Appleton Laboratory
Laser Zentrum Hannover e.V. (LZH)

Type

Article

Journal

New journal of physics

Volume

12

ISSN

1367-2630

Publication date

30.11.2010

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

General Physics and Astronomy

Electronic version(s)

https://doi.org/10.1088/1367-2630/12/11/113056 (Access: Open)