Optically trapped probes with nanometer-scale tips for femto-Newton force measurement

verfasst von

M. R. Pollard, S. W. Botchway, B. Chichkov, E. Freeman, R. N.J. Halsall, D. W.K. Jenkins, I. Loader, A. Ovsianikov, A. W. Parker, R. Stevens, R. Turchetta, A. D. Ward, M. Towrie

Abstract

We describe the development of a novel force probe, controlled by multiple optical traps, with a nanometer-scale tip that protrudes outside the direct laser radiation field. We have measured forces to an accuracy of 240 fN, which enables future experiments that probe photo-sensitive components (such as biological cells) and non-transparent objects. The probes were produced using two methods, electron beam lithography and two-photon polymerization, with the latter providing approximately twice as much trapping stiffness.

Externe Organisation(en)

Rutherford Appleton Laboratory (RAL)
Laser Zentrum Hannover e.V. (LZH)

Typ

Artikel

Journal

New journal of physics

Band

12

ISSN

1367-2630

Publikationsdatum

30.11.2010

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Allgemeine Physik und Astronomie

Elektronische Version(en)

https://doi.org/10.1088/1367-2630/12/11/113056 (Zugang: Offen)