Interface and Bulk Absorption of Oxide Layers and Correlation to Damage Threshold at 1.06 μm

authored by

Detlev Ristau, X. C. Dang, Jürgen Ebert

Abstract

The authors describe an infrared line scanning technique for measuring the temporal and spatial development of a temperature field which is generated by a high power cw Nd-laser on the surface of a coated sample. A theoretical model based on the solution of the differential equation of heat transport for an instantaneous point source is discussed. In this theory the optical and thermal properties of a laser heated single layer are related to its temperature field. Investigations on a temperature calibration technique are made in order to rule out the effect of different emissivities of the coating materials under test. Interface and bulk absorption of single layers and multilayer stacks are measured and related to the laser damage threshold attained from 15 ns pulses at 1. 064 mu m. The layers are produced by e-beam evaporation and by ion-beam assisted deposition. Results are given on TiO//2, Ta//2O//5, HfO//2, Al//2O//3 and SiO//2.

Organisation(s)

Institute of Quantum Optics

Type

Conference contribution

Pages

298-312

No. of pages

15

Publication date

1986

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

General Engineering

Electronic version(s)

https://doi.org/10.1520/STP23131S (Access: Unknown)