Quantum calibrated magnetic force microscopy
- authored by
- Baha Sakar, Yan Liu, Sibylle Sievers, Volker Neu, Johannes Lang, Christian Osterkamp, Matthew L. Markham, Osman Öztürk, Fedor Jelezko, Hans W. Schumacher
- Abstract
We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray-field distribution of the MFM tip using a single nitrogen vacancy (NV) center in diamond. From the measured stray-field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images to quantum calibrated stray-field maps. This approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray-field measurements in a field range inaccessible to scanning NV magnetometry. Quantum calibrated measurements of a stray-field reference sample allow its use as a transfer standard, opening the road towards fast and easily accessible quantum traceable calibrations of virtually any MFM.
- External Organisation(s)
-
Physikalisch-Technische Bundesanstalt PTB
Gebze Technical University
Beijing Academy of Quantum Information Sciences
Ulm University
Leibniz Institute for Solid State and Materials Research Dresden (IFW)
Element Six Global Innovation Centre (GIC)
- Type
- Article
- Journal
- Physical Review B
- Volume
- 104
- ISSN
- 2469-9950
- Publication date
- 01.12.2021
- Publication status
- Published
- Peer reviewed
- Yes
- ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials, Condensed Matter Physics
- Electronic version(s)
-
https://doi.org/10.1103/PhysRevB.104.214427 (Access:
Unknown)