Preparation and characterization of polymer layer systems for validation of 3D Micro X-ray fluorescence spectroscopy

authored by: Ina Schaumann, Wolfgang Malzer, Ioanna Mantouvalou, Lars Lühl, Birgit Kanngießer, Rainer Dargel, Ulrich Giese, Carla Vogt
Abstract: For the validation of the quantification of the newly-developed method of 3D Micro X-ray fluorescence spectroscopy (3D Micro-XRF) samples with a low average Z matrix and minor high Z elements are best suited. In a light matrix the interferences by matrix effects are minimized so that organic polymers are appropriate as basis for analytes which are more easily detected by X-ray fluorescence spectroscopy. Polymer layer systems were assembled from single layers of ethylene-propylene-diene rubber (EPDM) filled with changing concentrations of silica and zinc oxide as inorganic additives. Layer thicknesses were in the range of 30-150 μm. Before the analysis with 3D Micro-XRF all layers have been characterized by scanning micro-XRF with regard to filler dispersion, by infrared microscopy and light microscopy in order to determine the layer thicknesses and by ICP-OES to verify the concentration of the X-ray sensitive elements in the layers. With the results obtained for stacked polymer systems the validity of the analytical quantification model for the determination of stratified materials by 3D Micro-XRF could be demonstrated.
Organisation(s): Institute of Inorganic Chemistry
External Organisation(s): Technische Universität Berlin
German Institute of Rubber Technology (DIK e.V.)
Type: Article
Journal: Spectrochimica Acta - Part B Atomic Spectroscopy
Volume: 64
Pages: 334-340
No. of pages: 7
ISSN: 0584-8547
Publication date: 04.2009
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: Analytical Chemistry, Atomic and Molecular Physics, and Optics, Instrumentation, Spectroscopy
Electronic version(s): https://doi.org/10.1016/j.sab.2009.03.004 (Access: Closed)

BibTeX

@article{9145cfc42f2a4c24a9dec1f86dd3bdd2,
title = "Preparation and characterization of polymer layer systems for validation of 3D Micro X-ray fluorescence spectroscopy",
abstract = "For the validation of the quantification of the newly-developed method of 3D Micro X-ray fluorescence spectroscopy (3D Micro-XRF) samples with a low average Z matrix and minor high Z elements are best suited. In a light matrix the interferences by matrix effects are minimized so that organic polymers are appropriate as basis for analytes which are more easily detected by X-ray fluorescence spectroscopy. Polymer layer systems were assembled from single layers of ethylene-propylene-diene rubber (EPDM) filled with changing concentrations of silica and zinc oxide as inorganic additives. Layer thicknesses were in the range of 30-150 μm. Before the analysis with 3D Micro-XRF all layers have been characterized by scanning micro-XRF with regard to filler dispersion, by infrared microscopy and light microscopy in order to determine the layer thicknesses and by ICP-OES to verify the concentration of the X-ray sensitive elements in the layers. With the results obtained for stacked polymer systems the validity of the analytical quantification model for the determination of stratified materials by 3D Micro-XRF could be demonstrated.",
keywords = "3D X-ray fluorescence spectroscopy, Inorganic fillers in organic matrix, Polymer multilayer systems",
author = "Ina Schaumann and Wolfgang Malzer and Ioanna Mantouvalou and Lars L{\"u}hl and Birgit Kanngie{\ss}er and Rainer Dargel and Ulrich Giese and Carla Vogt",
year = "2009",
month = apr,
doi = "10.1016/j.sab.2009.03.004",
language = "English",
volume = "64",
pages = "334--340",
journal = "Spectrochimica Acta - Part B Atomic Spectroscopy",
issn = "0584-8547",
publisher = "Elsevier",
number = "4",
}