An Accurate Determination of the Characteristic Impedance Matrix of Coupled Symmetrical Lines on Chips Baser on High Frequency S-Parameter Measurements
- verfasst von
- Thomas Michael Winkel, Lohit Sagar Dutta, Hartmut Grabinski
- Abstract
A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
- Organisationseinheit(en)
-
Laboratorium f. Informationstechnologie
- Externe Organisation(en)
-
IBM
- Typ
- Aufsatz in Konferenzband
- Seiten
- 223-226
- Anzahl der Seiten
- 4
- Publikationsdatum
- 1997
- Publikationsstatus
- Veröffentlicht
- Peer-reviewed
- Ja
- ASJC Scopus Sachgebiete
- Computernetzwerke und -kommunikation, Hardware und Architektur, Elektrotechnik und Elektronik
- Elektronische Version(en)
-
https://doi.org/10.1109/ARFTG.1997.327232 (Zugang:
Geschlossen)
