Correlation of multiple scattering features in XANES spectra of Al and Si K edges to the AlOSi bond angle in aluminosilicate sodalites
An empirical study
- verfasst von
- M. Fröba, J. Wong, P. Behrens, P. Sieger, M. Rowen, T. Tanaka, Z. Rek, J. Felsche
- Abstract
Using a YB66 monochromator X-ray absorption measurements were carried out at the Al K and Si K absorption edges of a series of aluminosilicate sodalites. The AlOSi bridging angle of the selected sodalites varies from 138° to 148° and the structure of the XANES with its different multiple scattering (MS) features shows a strong angular dependence. Increasing the angle results in a decrease of the MS intensities. This dependence is especially pronounced at the Al K edges which contain a couple of separated well-resolved peaks whereas the corresponding features at the Si K edges are smeared out due to a strong overlapping of the peaks.
- Externe Organisation(en)
-
Lawrence Livermore National Laboratory
Universität Konstanz
Stanford University
National Institute for Materials Science Tsukuba
- Typ
- Artikel
- Journal
- Physica B: Physics of Condensed Matter
- Band
- 208-209
- Seiten
- 65-67
- Anzahl der Seiten
- 3
- ISSN
- 0921-4526
- Publikationsdatum
- 01.03.1995
- Publikationsstatus
- Veröffentlicht
- Peer-reviewed
- Ja
- ASJC Scopus Sachgebiete
- Elektronische, optische und magnetische Materialien, Physik der kondensierten Materie, Elektrotechnik und Elektronik
- Elektronische Version(en)
-
https://doi.org/10.1016/0921-4526(94)00820-L (Zugang:
Geschlossen)
