Continuous wave CO2 laser induced damage thresholds in optical components

verfasst von
Keith Puttick, Rune Holm, Detlev Ristau, Urs Natzschka, George Kiriakidis, Nirmal Garawal, Eddie Judd, David Holland, David Greening, Nick Ellis, Mark Wilkinson, Miguel Garcia Pamies, Celestino Sanviti
Abstract

The measurement of intrinsic laser induced damage thresholds (LIDT) in optical components for continuous wave (CW) CO2 radiation has been investigated. A combination of analytical and numerical models showed that the temperature rise is mainly determined by the surface absorption in transmissive as well as reflective components, and is proportional to the ratio of power to linear dimension (P/d) of the irradiated spot rather than to the conventional power/area (P/d2) parameter. The former ratio therefore represents the correct power scaling law for LIDT measurement in CW laser systems. The precise time domain within which this law holds is a function of spot diameter. This prediction has been confirmed by experimental LIDT tests on well characterised uncoated ZnSe substrates and copper mirrors, and on coated ZnSe windows and copper mirrors. Measured P/d values, though lower than predicted by modelling are considerably higher than those inferred from the technical literature, and show that transmissive components may be used at much higher powers than are at present believed. The results indicate that surface absorption occurs primarily in the sub-surface processing layer. This has been shown by transmission electron microscopy and spectroscopic ellipsometry to be a few hundred nm in depth.

Externe Organisation(en)
Laser Zentrum Hannover e.V. (LZH)
ICS-FORTH
Davin Optical Ltd.
V&S Scientific Ltd.
Laser Beam Products Ltd.
Laser Quanta SA
University of Surrey
Typ
Aufsatz in Konferenzband
Seiten
188-198
Anzahl der Seiten
11
Publikationsdatum
20.04.1997
Publikationsstatus
Veröffentlicht
Peer-reviewed
Ja
ASJC Scopus Sachgebiete
Elektronische, optische und magnetische Materialien, Physik der kondensierten Materie, Angewandte Informatik, Angewandte Mathematik, Elektrotechnik und Elektronik
Elektronische Version(en)
https://doi.org/10.1117/12.307045 (Zugang: Geschlossen)